EXIS Key Measurement Requirements Chart
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EXIS Key Measurement Requirements Chart |
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|---|---|---|---|---|---|
| Parameter | Requirement | Design | |||
| XRS λ Range | 0.05 nm — 0.8 nm | 0.05 nm — 0.8 nm | |||
| XRS Dynamic Range | 10-9 W/m2 — 10-3 W/m2 | 10-9 W/m2 — 10-3 W/m2 | |||
| XRS SNR | 1:1 over 10 min. average | ≻30:1 over 10 min. average | |||
| XRS Data Product Accuracy | ≤20% over mission life | 14% over mission life | |||
| XRS Cadence | ≤3 s | 1 s | |||
| EUVS λ Range | 5 - 127 nm | 5 -127 nm (data product) | |||
| EUVS Δ λ Resolution | From 5 to 35 nm : 10 nm bins From 35 to 115 nm : 40 nm bins L-α (121.6 nm) : 10 nm (FWHM) |
5 — 115 nm; 5 nm bins 117 — 127; 10 nm bins |
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| EUVS SNR | 1:1 over 10 min average | ≻20:1 over 10 min average | |||
| EUVS Data Product Accuracy | ≤20% over mission life | 18% over mission life | |||
| EUVS Cadence | ≤30 s | ≤10 s | |||
| EUVS Measurements | solar lines at 25.6, 28.4, 30.4, 117.5, 121.6, 133.5, 140.5 nm; Mg II index | ||||